Embedded Test Equipment Used to Perform Embedded Test
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It is only natural that military / aerospace equipment requires additional testing equipment.
The original IBM PC is very surprising in the amount of built-in test equipment.
In the case of your equipment, the test device and some statistical analysis will do the trick. This can be done in hardware in keys, but frankly, it would be easier with some software. Use two serial USB to RS232 serial converters to create a USB short circuit device. Send a lot of data, checksum packets and measure the error rate.
I assume that your errors occur on the input as well as on the outside.
In fact, your hardware guys should look at some application notes; USB IS hotplug-safe IF made in accordance with the book. In the fiber optic network, there is a chip connection on the board to prevent this. The USB chip is connected to the host, powered by the host, and the interface to the USB chip is SPI, which is optically connected to the rest of the board.
Like you, the chips partially do not work. Damaged devices can work normally for several months, and then die. Electrostatic discharge ("static heading") can do the same thing you are describing. The device may be damaged by sensations that are too small for you.
Wires and features in semiconductors are microscopic and are easily damaged by stray electricity. If the hardware design is mostly right, the cause of the problems you were experiencing is probably the ESD when the devices are being processed to connect / disconnect. Your devi has its own power supply, and its grounding floats relative to the other end of the USB cable until it is connected.
Hope this helps.
Tim Williscroft
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